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Keywords

TAC/Title Abstract Claims TACD/Title Abstract Claims Description AC/Abstract Claims ACD/Abstract Claims Description TA/Title Abstract TI/Title ABST/Abstract CLM/Claims CL/Independent Claim DESCR/Description

Related Parties

PA/Applicant PATMS/Applicant CAS/Patentee ADDR/Address INN/Inventor INNTMS/Inventor AGC/Agency NEWDLJG/Agency AGT/Agent CO/Country Code TOC/Original Technical Country/Regions RO/Receiving Office

DPI

IDX/DPI DPIT/Technical Value DPIL/Legal Value DPIM/Market Value DPIS/Strategic Value DPIE/Economic Value REFBYN/Number of being cited REFBSCYN/Number of Citations by Examiners REFPN/Number of Patent Citations REFPCN/Number of Countries/Regions of Cited Patent REFNPN/Number of Non-patent Citations IPCBN/Number of IPC Class IPCSCN/Number of IPC Subclass CLMN/Number of Claims ICLMN/Independent Claims Qty CLZS/Number of Words of Major Claims DNP/PDF Number of Description Pages PERIOD/Survival Time RET/Remaining Period of Validity IFMLN/innojoy Family Qty 检索助手_布局国家数 SFMLC/PCT International Application IFMLC/Tripartite Patent(US/JP/EP) BZ/Standard Patent INV/Times of Invalidations TRA/Assignment Times LIC/License Times PLE/Pledge Times

Number/Date

AN/Application No. AD/Application Date PNM/Publication No. PD/Publication Date SQGGR/Granted Date PR/Priority DAN/Divided From TZH/Family CLSD/Current Legal Status Publication Date IAN/PCT Application IPN/Int. Publication DEN/Entry Date

Classification

SIC/IPC SEC/ECLA CPC/Cooperative Patent Classification CPCSETS/CPC combination code FTERM/Japan Classification

Standard

ETSIBZ/ETSI Standard BZH/Standard No. BZC/Declaring Companies BZD/Declaration Date

Legal

CLS/Current Legal Status LV/Validity SQRLX/Applicant Type SQFS/Application Mode EPRC/Country/Regions with the Earliset Priority CFP/Customs Filing Patent

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